• Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. By: Sandeep K. Goel

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Sandeep K. Goel

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Autorius Sandeep K. Goel
Leidimo metai 2017 m.
Puslapių skč. 264 psl.
Viršelis Minkštas viršelis
ISBN 9781138075771
Kategorijos Nanotehnoloģija

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by Krishnendu Chakrabarty, Sandeep K. Goel.

Published by Taylor & Francis Group, (2017), Paperback, 264 pages.

Topics: Metal oxide semiconductors, complementary, Nanotechnology, Complementary Metal oxide semiconductors.

Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. By: Sandeep K. Goel

Testing for Small-Delay Defects in Na...

€105,48
€105,48 €108,74