Surface and Thin Film Analysis

A Compendium of Principles, Instrumentation, and Applications

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558 psl.

2011 m.

Kietas viršelis

Svītrkods: 9783527320479
Apraksts

Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.