Quantitative X-Ray Spectrometry
Grāmatas informācija
| Autors | Ron Jenkins |
|---|---|
| Izdevējs | Taylor & Francis Inc |
| Izdošanas gads | 1995 m. |
| Valoda | Angļu |
| Lappuses | 504 psl. |
| Formāts | Cietajos vākos |
| Izdevums | 2 ed |
| ISBN | 9780824795542 |
Par grāmatu
Discover the essential guide to X-ray spectrometry in "Quantitative X-Ray Spectrometry," authored by experts in the field and published by Taylor & Francis Inc. This comprehensive 2nd edition, released in 1995, spans 504 pages and delves into crucial aspects of X-ray spectrometry, covering everything from fundamental principles to the intricate details of instrument parameter selection and sample preparation.
This authoritative text also explores the innovative use of combined X-ray fluorescence and X-ray diffraction data, highlighting its fresh applications in diverse fields such as environmental studies, forensic science, minerals and ore analysis, and ceramic materials. Whether you're a seasoned professional or a student looking to deepen your knowledge, this book is an invaluable resource for anyone interested in the practical applications of X-ray spectrometry.
