Atomic Force Microscopy in Adhesion Studies

Explore the cutting-edge research in "Atomic Force Microscopy in Adhesion Studies," edited by over 100 esteemed authors and published by Brill in 2005. This comprehensive hardback edition spans 822 pages, delving deep into the intricate measurements of colloidal particle-solid adhesion and molecular forces. The book expertly covers solid surface imaging and mapping techniques, providing valuable insights into contact mechanics models relevant to both particle-substrate and particle-particle systems. Ideal for researchers and professionals in the field, this essential resource offers a thorough understanding of atomic force microscopy applications in adhesion studies. Enhance your library with this pivotal work that bridges theory and practical applications in nanotechnology and materials science.